A modified goniometer specimen holder for the Siemens electron microscope operating under long focal length conditions
- 1 May 1964
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 41 (5), 327-328
- https://doi.org/10.1088/0950-7671/41/5/331
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A simple goniometer stage for the Siemens electron microscopeJournal of Scientific Instruments, 1962