A simple goniometer stage for the Siemens electron microscope
- 1 June 1962
- journal article
- research article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 39 (6), 278-280
- https://doi.org/10.1088/0950-7671/39/6/306
Abstract
A simple goniometer stage is described which can be used in the ordinary object stage of the Siemens electron microscope without changing the air lock. The specimen tilt is [plus or minus] 22[degree] and the permissible object stage traverse is from [plus or minus] 0.4 mm to [plus or minus] 0.8mm according to the shape of the pole piece. The operational principles of the goniometer can be applied to other types of electron microscopes.This publication has 4 references indexed in Scilit:
- Double tilting specimen holder for the Siemens Elmiskop IJournal of Scientific Instruments, 1962
- QUANTITATIVE EXPERIMENTAL STUDY OF DISLOCATIONS AND STACKING FAULTS BY TRANSMISSION ELECTRON MICROSCOPYInternational Materials Reviews, 1961
- Anomalous electron absorption effects in metal foilsPhilosophical Magazine, 1960
- A kinematical theory of diffraction contrast of electron transmission microscope images of dislocations and other defectsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1960