Abstract
A simple goniometer stage is described which can be used in the ordinary object stage of the Siemens electron microscope without changing the air lock. The specimen tilt is [plus or minus] 22[degree] and the permissible object stage traverse is from [plus or minus] 0.4 mm to [plus or minus] 0.8mm according to the shape of the pole piece. The operational principles of the goniometer can be applied to other types of electron microscopes.

This publication has 4 references indexed in Scilit: