Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep‐Resistant Yttrium‐ and Lanthanum‐Doped Alumina Microstructures
- 1 October 1999
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 82 (10), 2865-2870
- https://doi.org/10.1111/j.1151-2916.1999.tb02169.x
Abstract
No abstract availableKeywords
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