Quantitative X-Ray Analysis
- 1 January 1986
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 40 references indexed in Scilit:
- Relative intensity factors for K, L and M shell x-ray linesX-Ray Spectrometry, 1982
- Quantitative analytical electron microscopyBulletin de Minéralogie, 1981
- Quantitative X-Ray Microanalysis: Instrumental Considerations and Applications to Materials SciencePublished by Springer Nature ,1979
- Principles of Thin Film X-Ray MicroanalysisPublished by Springer Nature ,1979
- X-ray microanalytical senstivity and spatial resolution in scanning transmission electron microscopesX-Ray Spectrometry, 1978
- Improved spatial resolution microanalysis in a scanning transmission electron microscopeX-Ray Spectrometry, 1977
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Practical Scanning Electron MicroscopyPublished by Springer Nature ,1975
- Low Energy X-Ray and Electron Absorption within Solids (100–1500 eV Region)Published by Springer Nature ,1974
- Quantitative Microprobe Analysis of Thin Insulating FilmsPublished by Springer Nature ,1968