The influence of single crystal structure on photon and secondary ion emission from Ar+ion bombarded aluminium

Abstract

In an experiment which combines photon detection and secondary ion analysis, the influence of single crystal structure on excited particle emission from a (100) Al surface bombarded with 50 KeV Ar⁺ ions is investigated. The measurements show that both photon and secondary ion yields exhibit characteristic transparency effects when the Al crystal is bombarded under channeling conditions. The angular width of the (110) channel was measured as 16 degrees for the photon yields for types I, II and III spectral lines and Al⁺ and Al⁺⁺ secondary ions. The minimum yield for photons was found to depend upon the excitation energy of the excited upper state of the optical transition studied and the minimum yield for ions was dependent upon the kinetic energy of the detected particle. Furthermore the effect of oxygen on the photon and secondary ion yields was studied under conditions in which the incident ion was channeled.