Dielectric impurities and surface instability in Langmuir probe plasma measurements
- 1 July 1974
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 7 (10), 1391-1401
- https://doi.org/10.1088/0022-3727/7/10/312
Abstract
Dielectric impurities on Langmuir probes are shown to be a source of surface instability in plasma measurements. The probe workfunction becomes current-dependent due apparently to electrostatic charging rendering the probe characteristic to become distorted. This instability can also give rise to the related phenomena of current hysteresis.Keywords
This publication has 22 references indexed in Scilit:
- Observations on the Effect of Surface Conditions on Langmuir ProbesJournal of Applied Physics, 1970
- A mass spectrometric study of the neutral and positive ionic species involved in carbon deposition from r.f. discharges in carbon containing gasesCarbon, 1968
- Probe Contamination in a Hydrogen Plasma†Journal of Electronics and Control, 1963
- Sources of surface contamination in vacuum evaporation systemsVacuum, 1963
- Formation of Thin Polymer Films by Electron BombardmentJournal of Applied Physics, 1960
- Probe Studies of Energy Distributions and Radial Potential Variations in a Low Pressure Mercury ArcJournal of Applied Physics, 1953
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953
- Probe Technique for the Measurement of Electron TemperatureJournal of Applied Physics, 1951
- XX. Dynamic probe characteristicsJournal of Computers in Education, 1947
- Free radicals in electrical dischargesTransactions of the Faraday Society, 1934