An analysis of space-dependent electric fields used in exciting flexural vibrations of piezoelectric beams
- 1 August 1990
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 1 (8), 731-737
- https://doi.org/10.1088/0957-0233/1/8/011
Abstract
Expressions for the mechanical deflection and the piezoelectric current of a piezoelectric beam located in a general electric field are derived. It is shown that the relationships between the interesting macroscopic electric and mechanical quantities are determined by only three integrals. Two of these are proportional to each other for a beam and the third is normally negligible. The remaining integral depends only on the dielectric field and can be determined by using the well known Laplace equation. The value of this integral can be estimated accurately without the need of a computer. It is shown by eigenmode decomposition that it is enough to study the static case in order to find the dynamic behaviour. The integrals are used in order to study some electrode configurations. It is indicated how the most efficient electrode configuration, for a given direction of vibration, can be determined.Keywords
This publication has 7 references indexed in Scilit:
- Design of a solid-state gyroscopic sensor made of quartzSensors and Actuators A: Physical, 1990
- Fracture testing of silicon microelements i n s i t u in a scanning electron microscopeJournal of Applied Physics, 1988
- Survey of quartz bulk resonator sensor technologiesIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1988
- The effect of electrode stiffness on the piezoelectric and elastic constants of a piezoelectric barThe Journal of the Acoustical Society of America, 1988
- Relative humidity measurement using a coated piezoelectric quartz crystal sensorSensors and Actuators, 1987
- Using elastic—plastic plane stress FEM programs to compute anti‐plane strainInternational Journal for Numerical Methods in Engineering, 1986
- Silicon as a mechanical materialProceedings of the IEEE, 1982