On the negative differential resistance effect in high-field semiconductor-dielectric systems
- 6 July 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (1), 55-57
- https://doi.org/10.1063/1.107667
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- New findings of pulsed surface breakdown along silicon in vacuumIEEE Transactions on Electron Devices, 1990
- Surface flashover of siliconIEEE Transactions on Electron Devices, 1990