New findings of pulsed surface breakdown along silicon in vacuum
- 1 December 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (12), 2466-2471
- https://doi.org/10.1109/16.64519
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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