InGaAsP/InP distributed-feedback injection lasers fabricated by one-step liquid phase epitaxy

Abstract
Fabrication and lasing characteristics of InGaAsP/InP distributed‐feedback injection lasers are described. An InGaAsP active layer, a p‐InP clad layer, and an n‐InGaAsP cap layer are successively grown on an InP substrate with a 0.32‐μm periodic corrugation. The diodes emit at a wavelength of 1.1 μm up to 170 K under pulsed operation. Single longitudinal mode oscillation and a small temperature dependence of the lasing wavelength of 0.054 nm/K are obtained in these diodes.