Measurements of kinetic processes in a self-sustained discharge XeF laser
- 1 July 1978
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 33 (1), 65-67
- https://doi.org/10.1063/1.90146
Abstract
The XeF* and F* sidelight emissions, the small‐signal gain, and the transient plasma absorption near the laser wavelength have been measured from a XeF self‐sustained discharge laser. We conclude that the production of XeF* in its lower vibrational levels requires collisions with He atoms, and that XeF* decays predominantly by radiative processes and He quenching. The transient absorption at the laser wavelength, believed to be due to F−, F*, F*2, and Xe+2, can be as large as ∼1–2%/cm at small‐signal gains of ∼8%/cm.Keywords
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