Error analysis for refractive-index profile determination from near-field measurements
- 1 May 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 8 (5), 625-633
- https://doi.org/10.1109/50.54467
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Index profiling of three-dimensional optical waveguides by the propagation-mode near-field methodJournal of Lightwave Technology, 1986
- Refractive-index profile and modal dispersion prediction for a single-mode optical waveguide from its far-field radiation patternJournal of Lightwave Technology, 1985
- Refractive-index-profile determination of single-mode optical fibers by a propagation-mode near-field scanning techniqueJournal of Lightwave Technology, 1983
- Index distribution of optical waveguides from their mode profileJournal of Lightwave Technology, 1983
- Characterisation of single-mode fibres by near-field measurementElectronics Letters, 1983
- Precise determination of refractive index and thickness in the Ti-diffused LiNbO_3 waveguideJournal of the Optical Society of America, 1978
- Optical waveguide refractive index profiles determined from measurement of mode indices: a simple analysisApplied Optics, 1976
- Modes in diffused optical waveguides of arbitrary index profileIEEE Journal of Quantum Electronics, 1975