Abstract
The self-consistent variational technique is used to calculate the mobility of two-dimensional electrons at the hetero-in-terfaces in AlInAs/InGaAs and InP/InGaAs single heterostructures. The sheet electron concentration dependence of the total mobility and each-scattering-limited mobility are shown. The predominance of the alloy-scattering-limited mobility is demonstrated. Model calculation of the two-dimensional electron mobility in an alloy-scattering-free InAs/GaAs monolayer superlattice with AlInAs as the barrier is also presented.