The development of Fresnel contrast analysis, and the interpretation of mean inner potential profiles at interfaces
- 30 June 2000
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 83 (3-4), 193-216
- https://doi.org/10.1016/s0304-3991(00)00015-2
Abstract
No abstract availableKeywords
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