The rotating sample technique for measurement of random backscattering yields from crystals and its application to β-alumina
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3), 225-228
- https://doi.org/10.1016/0029-554x(78)90864-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Structural determinations of single-crystal K β-alumina and cobalt-doped K β-aluminaJournal of Solid State Chemistry, 1976
- The optimization of a rutherford backscattering geometry for enhanced depth resolutionNuclear Instruments and Methods, 1975
- Defining the ``Random'' Spectrum as Used in the Channeling Technique of Nuclear BackscatteringApplied Physics Letters, 1972
- Secondary-Electron EmissionIEEE Transactions on Nuclear Science, 1968