Abstract
Various concentrations of Ge and Se donors were introduced into GaAs crystals by means of neutron transmutation doping. Three kinds of GaAs crystals were used: undoped, Cr-doped crystals, and a high-purity epitaxial layer. Hall coefficient R, resistivity ρ, and low-field magnetoresistance Δρρ were measured between 1.4 and 450 K. Good agreement was found between the measured concentrations of added donors and the values expected from the neutron-capture cross sections and the neutron fluences used. The analysis of the temperature dependence of the carrier concentration of the epitaxial sample gave somewhat smaller values for ND and NA, the concentration of donors and acceptors, than the analysis of the T dependence of μH, but NDNA was the same; this indicates that some deep-lying centers are present in this sample. At low T the magnetic field dependence of ρ of this sample was in good agreement with the theory of impurity conduction modified by Shklovskii. Δρρ of this sample was positive to the lowest T (1.4 K) and had two peaks; one at about 50 K corresponds to a maximum of μH and the second one at about 4.2 K corresponds to the temperature at which band conduction and impurity conduction are of equal magnitude. At low T all the undoped and Cr-doped crystals had a negative magnetoresistance whose magnitude increases with decreasing T. At low T, Δρρ changes from positive to negative as the room-temperature carrier concentration n0 reaches 2 × 1015 cm3. Above this carrier concentration Δρρ is negative and reaches a maximum value at n01×1016 cm3. Δρρ disappears when n0 exceeds the concentration of the true metallic state ncb5×1017 cm3. The closeness of the n0 value at which the negative Δρρ has its maximum value and the critical concentration Nc(34)×1016 cm3 at which the metal-nonmetal transition is observed indicates that these two phenomena are related.