Rapid scanning of spectral line profiles using an oscillating Fabry-P rot interferometer

Abstract

The theory, design, limits of resolution and practical application are considered for a time-resolved Fabry-Pérot interferometer in which the time resolution is achieved by the displacement of one of the etalon plates with a piezoelectric element. It is shown that with an etalon of 1 cm aperture (i) any line profile can be determined with an accuracy to about 2½% and (ii) the line profile can be scanned in minimum times of the order 10^-7 sec, the scan being repeated eight times in less than 10^-6 sec. Photoelectric recording gives the intensity profile directly on a linear intensity scale and linear wavelength/time scale.