CV profiling on p-p- and n-s.i.-In0.53Ga0.47As/InP heterointerfaces
- 3 August 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 174 (1-3), 331-336
- https://doi.org/10.1016/0039-6028(86)90431-0
Abstract
No abstract availableKeywords
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