Carrier Traps in Polyethylene Naphthalate (PEN): Photoelectret

Abstract

Electronic carrier traps in polyethylene naphthalate (PEN) were investigated by TSC and TL analysis in the temperature range from -196°C to 160°C. Two broad peaks were observed in the TSC and TL from PEN films illuminated with light of wavelength 360 nm at -196°C. The detrapping process was closely related to the molecular motions, the so-called γ and β relaxations. The apparent trap depths ranged from 0.1–0.5 eV.