A secondary ion time-of-flight mass spectrometer with an ion mirror
- 20 July 1988
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 85 (1), 43-67
- https://doi.org/10.1016/0168-1176(88)83004-0
Abstract
No abstract availableKeywords
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