Time-of-Flight Measurements of Cesium-Iodide Cluster Ions
- 3 January 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 50 (1), 27-30
- https://doi.org/10.1103/physrevlett.50.27
Abstract
Secondary ions , with up to ∼ 40, were produced by 8-keV bombardment of CsI. The yield of clusters decreased smoothly with when observed in a time-of-flight mass spectrometer at effective times ∼ 0.2 μs after emission. Clusters with were found to be metastable, with lifetimes ≪ 100 μs. A large anomaly in the population of the disintegration products was measured at ∼ 70 μs after emission, clusters being favored and suppressed.
Keywords
This publication has 12 references indexed in Scilit:
- Secondary ion mass spectrometry of metal halides. 2. Evidence for structure in alkali iodide clustersJournal of the American Chemical Society, 1982
- Ion Formation from Alkali Halide Solids by High Power Pulsed Laser IrradiationZeitschrift für Naturforschung A, 1982
- Fission fragment ionization mass spectrometry: Metastable decompositionsInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Secondary ion mass spectrometry of metal halides. 1. Stability of alkali iodide clustersThe Journal of Physical Chemistry, 1981
- A time-of-flight mass spectrometer for measurement of secondary ion mass spectraInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic CrystalsPhysical Review Letters, 1981
- High-performance secondary ion mass spectrometerReview of Scientific Instruments, 1980
- Threshold studies of secondary electron emission induced by macro-ion impact on solid surfacesNuclear Instruments and Methods, 1980
- SIMS study of the mechanism of cluster formation during ion bombardment of alkali halidesThe Journal of Chemical Physics, 1978
- Observation and Identification of Ion Dissociation Processes Occurring in the Drift Tube of a Time-of-Flight Mass SpectrometerReview of Scientific Instruments, 1964