The effects of stray capacitance on the Kelvin method for measuring contact potential difference
- 1 April 1970
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 3 (4), 482-488
- https://doi.org/10.1088/0022-3727/3/4/307
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Kelvin Device to Scan Large Areas for Variations in Contact PotentialReview of Scientific Instruments, 1962
- Work Function of Iron Surfaces Produced by Cleavage in VacuumPhysical Review B, 1959
- A Direct Comparison of the Kelvin and Electron Beam Methods of Contact Potential MeasurementPhysical Review B, 1952
- Temperature Dependence of the Work Function of Tungsten from Measurement of Contact Potentials by the Kelvin MethodPhysical Review B, 1940
- A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALSReview of Scientific Instruments, 1932
- V. Contact electricity of metalsJournal of Computers in Education, 1898