EFFECTS OF X-RAY IRRADIATION ON THE CHARACTERISTICS OF METAL-OXIDE-SILICON STRUCTURES
- 1 March 1966
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 8 (5), 124-126
- https://doi.org/10.1063/1.1754517
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- REVERSIBLE CHANGES IN TRANSISTOR CHARACTERISTICS CAUSED BY SCANNING ELECTRON MICROSCOPE EXAMINATIONApplied Physics Letters, 1965
- Transit time effects in gaseous and solid-state devicesProceedings of the IEEE, 1965
- n-inversion layers on oxidized p-type siliconProceedings of the IEEE, 1965