Electron diffraction from periodic arrays of misfit dislocations formed during epitaxial growth
- 1 February 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 48 (3), 385-393
- https://doi.org/10.1016/0040-6090(78)90019-6
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- X-ray diffraction study of large-angle twist grain boundariesPhilosophical Magazine, 1976
- X-ray diffraction from small-angle twist boundariesPhilosophical Magazine, 1976
- The detection of the periodic structure of high-angle twist boundariesPhilosophical Magazine, 1975
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973
- Grain boundary dislocation networks as electron diffraction gratingsPhilosophical Magazine, 1972
- An ultra-high vacuum electron microscope specimen chamber for vapour deposition studiesJournal of Physics E: Scientific Instruments, 1970
- On Bonding and Structure of Epitaxial Bicrystals I. Semi‐Infinite CrystalsPhysica Status Solidi (b), 1970
- On bonding and structure of epitaxial bicrystals. II. Thin filmsPhysica Status Solidi (b), 1970
- Electron microscopy and diffraction of twinned structures in evaporated films of goldPhilosophical Magazine, 1963