Identification of the Si(001) missing dimer defect structure by low bias voltage STM and LDA modelling
- 10 November 1995
- journal article
- Published by Elsevier in Surface Science
- Vol. 341 (3), L1042-L1047
- https://doi.org/10.1016/0039-6028(95)00794-6
Abstract
No abstract availableKeywords
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