Measurement of angle-resolved X-ray scattering from synthetic multilayers
- 1 May 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 246 (1-3), 348-351
- https://doi.org/10.1016/0168-9002(86)90104-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrorsJournal of Applied Crystallography, 1984
- X-ray mirror surfaces evaluated by an X-ray topographical techniqueNuclear Instruments and Methods in Physics Research, 1983
- Design of doubly focusing, tunable (5–30 keV), wide bandpass optics made from layered synthetic microstructuresNuclear Instruments and Methods in Physics Research, 1983