A Multi-Element Silicon Detector for X-Ray Flux Measurements
- 1 January 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 29 (1), 793-797
- https://doi.org/10.1109/tns.1982.4335961
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Study of Surface Effects in Thick Lithium Drifted Silicon Radiation DetectorsIEEE Transactions on Nuclear Science, 1964
- Leakage current in semiconductor junction radiation detectors and its influence on energy-resolution characteristicsNuclear Instruments and Methods, 1961
- Dichromatic Absorption Radiography. DichromographyActa Radiologica, 1953