Polarization dynamics and retention loss in fatigued PbZr0.4Ti0.6O3 ferroelectric capacitors

Abstract

Short-time retention loss behaviors were investigated for fatigued ${\mathrm{Pt/PbZr}}_{\text{0.4}}{\mathrm{Ti}}_{\text{0.6}}{\mathrm{O}}_3/\mathrm{Pt}$ capacitors. In the short-time regime of $\text{t<1\hspace{0.17em}}\mathrm{s},$ fatigued capacitors showed a significant loss in retained polarization, which could be well described by a power-law function. This behavior was interpreted in terms of a superposition of polarization relaxations with a relaxation time distribution. The effects of the pulse voltage on the relaxation time distribution suggested that the retention loss should be activated by a depolarization field. As the fatigue stress was applied, the retention loss became worse. This effect can be explained in terms of the increase of the depolarization field, possibly due to the growth of an interfacial passive layer.