Fabrication of Nanocrystalline Silicon with Small Spread of Particle Size by Pulsed Gas Plasma
- 1 June 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (6S), 4031-4034
- https://doi.org/10.1143/jjap.36.4031
Abstract
We have investigated the formation of nanocrystalline Si (nc-Si) in SiH4 plasma using a pulsed-H2 gas supply by very-high-frequency (VHF; 144 MHz) excitation. Nanocrystalline Si is formed in the gas phase of a SiH4 plasma cell by the coalescence of radicals. The particle size of nc-Si is determined by the growth time of nc-Si in the plasma cell. Supplying H2 into SiH4 plasma enhances nucleation of nc-Si. When the H2 gas supply is turned off, nucleated nc-Si particles grow larger in SiH4 plasma. In the next cycle of H2 gas supply, nc-Si particles grown in the previous cycle are pushed out of the cell into the deposition chamber. Using this method, fabrication of nc-Si with a diameter around 8 nm and a narrow spread (±1 nm) of particle size was realized.Keywords
This publication has 7 references indexed in Scilit:
- Size dependence of the characteristics of Si single-electron transistors on SIMOX substratesIEEE Transactions on Electron Devices, 1996
- Room-temperature single-electron memoryIEEE Transactions on Electron Devices, 1994
- Frequency effects in processing plasmas of the VHF bandPlasma Sources Science and Technology, 1993
- High quality a-Si:H films and interfaces prepared by VHF plasma CVDJournal of Non-Crystalline Solids, 1991
- Diagnostic Study of VHF Plasma and Deposition of Hydrogenated Amorphous Silicon FilmsJapanese Journal of Applied Physics, 1990
- Preparation of a-Si:H Films by VHF Plasma CVDMRS Proceedings, 1988
- Correlated discrete transfer of single electrons in ultrasmall tunnel junctionsIBM Journal of Research and Development, 1988