Determination of the Absolute Phase Change on Reflection at Chromium Films
- 1 August 1964
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 54 (8), 1052-1056
- https://doi.org/10.1364/josa.54.001052
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
- Phase Changes on Reflection from Evaporated Chromium FilmsJournal of the Optical Society of America, 1959
- Measurement of the Thickness of Thin Films by Multiple-Beam InterferenceNature, 1956
- The Thickness Measurement of Thin Films by Multiple Beam InterferometryJournal of Applied Physics, 1950
- Interferometric Determination of the Apparent Thickness of Thin Metallic FilmsNature, 1949
- Deutung der Anomalien der optischen Konstanten dünner MetallschichtenThe European Physical Journal A, 1939
- Études des propriétés optiques des lames métalliques très mincesAnnales de Physique, 1937