Interferometric Determination of the Apparent Thickness of Thin Metallic Films
- 1 June 1949
- journal article
- Published by Springer Nature in Nature
- Vol. 163 (4154), 916
- https://doi.org/10.1038/163916a0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The Growth of CrystalsProceedings of the Physical Society, 1948
- Interferometric Determination of Apparent Thickness of CoatingsNature, 1947
- Ueber die Phasenänderung des Lichtes bei der Reflexion und Methoden zur Dickenbestimmung dünner BlättchenAnnalen der Physik, 1887