Self-consistent study of dynamical and polarization effects in near-field optical microscopy
- 1 February 1992
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 9 (2), 298-305
- https://doi.org/10.1364/josab.9.000298
Abstract
A whole self-consistent method is developed in order to analyze the influence of incident light beam polarization on an image shape recently recorded from scanning tunneling optical devices. The electromagnetic coupling between the object and a nanometer-size detector is described from a dynamic matrix, including all dipolar correlations inside the system. This matrix, expressed in terms of field propagators, permits us to analyze the physical mechanisms responsible for the conversion of evanescent waves into homogeneous propagating modes inside the detector. The numerical results are compared with those obtained for layered metallic or dielectric nanoparticles deposited upon a glass substrate. The shape and the contrast of the images are both sensitive to the field polarization and to the external frequency in the case of metallic objects. Moreover, as was observed in experimental studies, the p-polarized mode seems to give better contrast in the images.Keywords
This publication has 36 references indexed in Scilit:
- Photon tunneling microscopyApplied Optics, 1990
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Scanning tunneling optical microscopyOptics Communications, 1989
- Observation of Single-Particle Plasmons by Near-Field Optical MicroscopyPhysical Review Letters, 1989
- New form of scanning optical microscopyPhysical Review B, 1989
- Super-resolution fluorescence near-field scanning optical microscopyApplied Physics Letters, 1986
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Near Field Scanning Optical Microscopy (NSOM)Biophysical Journal, 1986
- Optical characteristics of 0.1 μm circular apertures in a metal film as light sources for scanning ultramicroscopyJournal of Vacuum Science & Technology B, 1985
- Optical stethoscopy: Image recording with resolution λ/20Applied Physics Letters, 1984