Determination of Compensation Density by Hall and Mobility Analysis in Copper-Doped Germanium
- 15 July 1972
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 6 (2), 470-477
- https://doi.org/10.1103/physrevb.6.470
Abstract
The carrier concentration and mobility, as determined from the Hall effect, have been analyzed on a computer for a series of copper-doped-germanium samples. Both types of analysis gave good agreement in determining the density of compensating donors over the range of 4× to 6× . This agreement is good evidence in support of the theory of ionized-impurity scattering. It was found that neutral-impurity-scattering theory had to be modified to account for the nonhydrogenic nature of the copper impurity center. The degeneracy of the copper acceptor was found to be four, in agreement with the effective-mass calculation.
Keywords
This publication has 21 references indexed in Scilit:
- Transverse Magnetoresistance and Hall Effect in-Type GermaniumPhysical Review B, 1968
- An Algorithm for Least-Squares Estimation of Nonlinear ParametersJournal of the Society for Industrial and Applied Mathematics, 1963
- Impurity Conduction in Copper Doped GermaniumProceedings of the Physical Society, 1963
- Electrical Conduction in-Type Germanium at Low TemperaturesPhysical Review B, 1962
- Triple Acceptors in GermaniumPhysical Review B, 1957
- Hydrogen atom in a strong magnetic fieldJournal of Physics and Chemistry of Solids, 1956
- Energy band structure in p-type germanium and siliconJournal of Physics and Chemistry of Solids, 1956
- Amphoteric Impurity Action in GermaniumPhysical Review B, 1955
- Electrical Properties of Germanium Semiconductors at Low TemperaturesPhysical Review B, 1955
- Electrical Properties of-Type GermaniumPhysical Review B, 1954