Hydrogen mobility under beam impact when using the 1H(15N, αγ) nuclear reaction for material analysis
- 15 August 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 187 (2-3), 573-580
- https://doi.org/10.1016/0029-554x(81)90391-8
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Amorphous semiconductor thin films characterization by nuclear microanalysisJournal of Radioanalytical and Nuclear Chemistry, 1980
- Dissent from the dihydride model of the vibrational spectra of amorphous silicon-hydrogen alloysSolid State Communications, 1980
- Photoluminescence in sputtered amorphous silicon-hydrogen alloysPhilosophical Magazine Part B, 1980
- Nuclear reaction analysis of hydrogen in amorphous silicon and silicon carbide filmsNuclear Instruments and Methods, 1980
- Influence of ion beam bombardment in hydrogen surface layer analysisNuclear Instruments and Methods, 1979
- Negative-States in the Gap in Hydrogenated Amorphous SiliconPhysical Review Letters, 1978
- Measurement of the Threshold Behavior of Production in AnnihilationPhysical Review Letters, 1978
- The application of nuclear reactions for quantitative hydrogen analysis in a variety of different materials problemsNuclear Instruments and Methods, 1978
- 15N hydrogen profiling: Scientific applicationsNuclear Instruments and Methods, 1978
- Emploi de la réaction résonnante 1H(15N, αγ) pour l'obtention de profils de concentration d'hydrogène dans les matériauxRevue de Physique Appliquée, 1978