NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor
Open Access
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 46 (2), 264-268
- https://doi.org/10.1109/19.571828
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Conversion of a 2-terminal-pair bridge to a 4-terminal-pair bridge for increased range and precision in impedance measurementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Loading effects in resistance scalingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Leakage current detection in cryogenic current comparator bridgesIEEE Transactions on Instrumentation and Measurement, 1993
- Improvements in resistance scaling at NIST using cryogenic current comparatorsIEEE Transactions on Instrumentation and Measurement, 1993
- NBS determination of the fine-structure constant, and of the quantized Hall resistance and Josephson frequency-to-voltage quotient in SI unitsIEEE Transactions on Instrumentation and Measurement, 1989
- Determination of the time-dependence of Omega /sub NBS/ using the quantized Hall resistanceIEEE Transactions on Instrumentation and Measurement, 1989
- New realization of the ohm and farad using the NBS calculable capacitorIEEE Transactions on Instrumentation and Measurement, 1989
- New NBS Measurements of the Absolute Farad and OhmIEEE Transactions on Instrumentation and Measurement, 1974
- Techniques for comparing four-terminal-pair admittance standardsJournal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation, 1970
- AC Bridge Methods for the Measurement of Three-Terminal AmittancesIEEE Transactions on Instrumentation and Measurement, 1964