Scanning Auger electron microscopy
- 1 November 1979
- journal article
- Published by IOP Publishing in Physics in Technology
- Vol. 10 (6), 259-265
- https://doi.org/10.1088/0305-4624/10/6/i02
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- On the influence of backscattered electrons on the lateral resolution in scanning auger microscopyApplied Physics A, 1977
- Direct observation of grain-boundary diffusion by scanning Auger microscopyPhilosophical Magazine, 1977
- Scanning auger electron microscopy at 30 nm resolutionPhilosophical Magazine, 1976
- Grain boundary segregationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1973
- Electron Gun Using a Field Emission SourceReview of Scientific Instruments, 1968