X-ray diffraction study of microstructure in ZnS thin films grown from zinc acetate by atomic layer epitaxy
- 1 February 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 124 (3-4), 317-321
- https://doi.org/10.1016/0040-6090(85)90282-2
Abstract
No abstract availableKeywords
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