Selected Analytical Tools Yield a Better Insight into Electroluminescent Thin Films)
- 16 February 1984
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 81 (2), 647-655
- https://doi.org/10.1002/pssa.2210810226
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Cross-sectional transmission electron microscopy of electroluminescent thin films fabricated by various deposition methodsJournal of Crystal Growth, 1983
- How the ZnS:Mn layer thickness contributes to the performance of AC thin-film EL devices grown by atomic layer epitaxy (ALE)IEEE Transactions on Electron Devices, 1983
- Thin-film electroluminescent devices: Influence of Mn-doping method and degradation phenomenaIEEE Transactions on Electron Devices, 1983
- Experimental results on the stability of ac thin-film electroluminescent devicesJournal of Applied Physics, 1982
- Microstructure and light emission of ac thin-film electroluminescent devicesJournal of Applied Physics, 1982
- Application of thin film electroluminescent devicesJournal of Luminescence, 1981
- Properties of ZnS Films Evaporated in High VacuumJapanese Journal of Applied Physics, 1974