Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors
- 1 November 1952
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 40 (11), 1429-1434
- https://doi.org/10.1109/jrproc.1952.273975
Abstract
A theoretical expression for the equivalent base resistance ϒb of point-contact transistors is derived here. This expression is shown to check experimental values reasonably well if the severity of some assumptions made for purposes of analysis is considered. Electrode spacing, germanium-slice thickness, and resistivity of the semiconductor are shown to be the properties that affect ϒb</sub. primarily.Keywords
This publication has 4 references indexed in Scilit:
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- Single-Crystal GermaniumProceedings of the IRE, 1952
- Transistor Forming Effects in n-Type GermaniumProceedings of the IRE, 1952
- Equivalent Circuits of Linear Active Four-Terminal Networks*Bell System Technical Journal, 1948