Rietveld refinement of Y2O3 using the Pearson VII profile shape function
- 1 June 1989
- journal article
- Published by Wiley in Crystal Research and Technology
- Vol. 24 (6), 607-611
- https://doi.org/10.1002/crat.2170240609
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- The use of the Durbin–Watsondstatistic in Rietveld analysisJournal of Applied Crystallography, 1987
- The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysisJournal of Applied Crystallography, 1986
- Real structure of undoped Y2O3 single crystalsActa crystallographica Section B, Structural science, crystal engineering and materials, 1984
- On the atomic scattering factor for O2−Acta Crystallographica Section A Foundations of Crystallography, 1983
- A new form of sodium Kurrol salt studied by the Rietveld method from X-ray diffraction dataActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1982
- The influence of systematic errors in crystal structure refinements using Guinier camera X-ray intensity dataActa Crystallographica Section A, 1981
- Constrained powder-profile refinement based on generalized coordinates. Application to X-ray data of isotactic polypropyleneActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1980
- Normal probability plot analysis of error in measured and derived quantities and standard deviationsActa Crystallographica Section A, 1971
- A neutron diffraction study of the crystal structure of the C-form of yttrium sesquioxideActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969
- A refinement of the crystal structure of yttriaActa Crystallographica, 1965