Performance of the new high mass resolution time of flight atom probe
- 1 June 1981
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 52 (6), 810-818
- https://doi.org/10.1063/1.1136701
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Surface analysis and grain-boundary segregation measurements using atom-probe techniquesSurface Science, 1979
- Imaging atom-probe mass spectroscopyProgress in Surface Science, 1978
- Field emission and field ion microscope study of Ga, In and Sn on W: Structure, work function, diffusion and binding energySurface Science, 1976
- Aiming performance of the atom probeReview of Scientific Instruments, 1975
- Energy deficits in pulsed field evaporation and deficit compensated atom-probe designsReview of Scientific Instruments, 1974
- Premature field evaporation in the atom probeReview of Scientific Instruments, 1974
- New Directional and Energy Focusing Time of Flight Mass Spectrometers for Special Tasks in Vacuum and Surface PhysicsJournal of Vacuum Science and Technology, 1972
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968
- Ablenkung von Kathoden- und Kanalstrahlen am Rande eines Kondensators, dessen Streufeld durch eine Blende begrenzt istThe European Physical Journal A, 1935