Electromigration failure in filaments through Langmuir-Blodgett films
- 31 July 1986
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 59 (1), 7-9
- https://doi.org/10.1016/s0038-1098(86)80003-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The preparation of oleophilic surfaces for Langmuir—Blodgett depositionJournal of Colloid and Interface Science, 1986
- Metallic conduction through Langmuir-Blodgett filmsThin Solid Films, 1986
- Electro-migration as a probe to study localizationSolid State Communications, 1981