X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) analysis of UV‐exposed polystyrene
- 1 November 1995
- journal article
- Published by Wiley in Macromolecular Chemistry and Physics
- Vol. 196 (11), 3695-3705
- https://doi.org/10.1002/macp.1995.021961122
Abstract
No abstract availableKeywords
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