Focussing of synchroton radiation X-ray beams using synthetic multilayer mirrors
- 1 April 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 255 (3), 603-605
- https://doi.org/10.1016/0168-9002(87)91231-9
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- High-energy x-ray microscopy with multilayer reflectors (invited)Review of Scientific Instruments, 1986
- X-ray microscope with multilayer mirrorsApplied Optics, 1986
- Trace element determination using synchrotron radiationAnalytical Chemistry, 1986
- Formation of Optical Images by X-RaysJournal of the Optical Society of America, 1948