Positive charge traps in silicon dioxide films: A comparison of population by X-rays and band-gap light
- 1 May 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 27 (1), 165-170
- https://doi.org/10.1016/0040-6090(75)90019-x
Abstract
No abstract availableKeywords
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