Structural Reliability of Yttria‐Doped Hot‐Pressed Silicon Nitride at Elevated Temperatures
- 1 December 1983
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 66 (12), 884-889
- https://doi.org/10.1111/j.1151-2916.1983.tb11006.x
Abstract
No abstract availableKeywords
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