Optical characterisation of porous silicon layers by spectrometric ellipsometry in the 1.5–5 eV range
- 1 October 1992
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 84 (3), 293-296
- https://doi.org/10.1016/0038-1098(92)90124-r
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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