Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O3 films on sapphire and Pt-coated silicon substrates
- 1 July 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 230 (1), 15-27
- https://doi.org/10.1016/0040-6090(93)90341-l
Abstract
No abstract availableKeywords
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