Structural and electrical properties of CrSi2 thin film resistors
- 1 August 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 36 (2), 357-360
- https://doi.org/10.1016/0040-6090(76)90033-x
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Structural and electrical properties of chromium and nickel films evaporated in the presence of oxygenThin Solid Films, 1974
- Structural and electrical properties of evaporated Cr-Ni films as a function of gas pressureThin Solid Films, 1973
- Preparation and properties of tantalum thin filmsThin Solid Films, 1972
- The crystal growth and thermoelectric properties of chromium disilicideJournal of Materials Science, 1972
- Tantalum thin film resistorsThin Solid Films, 1972
- Sputtered Silicon–Chromium Resistive FilmsJournal of Vacuum Science and Technology, 1969
- The structural and electrical properties of 80:20 NiCr thin filmsThin Solid Films, 1967