Surface force interactions between micrometer-size polystyrene spheres and silicon substrates using atomic force techniques
- 1 January 1994
- journal article
- Published by Taylor & Francis in Journal of Adhesion Science and Technology
- Vol. 8 (3), 197-210
- https://doi.org/10.1163/156856194x01059
Abstract
The surface force interactions between a single micrometer-size polystyrene sphere and a p-type silicon substrate were investigated using atomic force microscope techniques. The force of removal an...Keywords
This publication has 33 references indexed in Scilit:
- Determination of the dependence of the surface force induced contact radius on particle radius: Cross-linked polystyrene spheres on SiO2/siliconJournal of Materials Research, 1993
- Effects of thin, semi‐rigid coatings on the adhesion‐induced deformations between rigid particles and soft substratesJournal of Applied Physics, 1993
- Adhesion Induced Flow of a Soft Polyester-Polydimethylsiloxane Copolymer Substrate Over Micrometer and Submicrometer Size Spherical Particles: Observations of Anomalously Large Menisci, Interparticle Bridging and Particle EncapsulationThe Journal of Adhesion, 1992
- Micromachined silicon cantilevers and tips for scanning probe microscopyMicroelectronic Engineering, 1991
- Direct measurement of colloidal forces using an atomic force microscopeNature, 1991
- Direct measurement of molecular level adhesion forces between biaxially oriented solid polymer filmsLangmuir, 1991
- Observation of metallic adhesion using the scanning tunneling microscopePhysical Review Letters, 1990
- Microfabrication of cantilever styli for the atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- Surface energy and the contact of elastic solidsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971